Ackrediteringens omfattning

Transkript

1 Elektrisk provning Making and Breaking tests - Circuit Breakers (E1) Pressure Relief tests and internal arc tests - Surge Arresters and instrument transformers (E2) Breaking Capacity, Service-duty - Onload Tap Changer (E3) Making and Breaking tests - HV Switches and Fuses (E4) Internal arc tests on Metal-enclosed Switchgear, GIS and Insulator sets (E5) IEC sub-clause to IEC IEC sub-clause to IEC sub-clause to IEC sub-clause IEC sub-clause to ANSI/IEEE C37.09 sub-clause 4.6 to 4.8 and to 4.12 ANSI/IEEE C37.09a sub-clause ANSI/IEEE C37.09b sub-clause 4.8, ANSI/IEEE C37.20 sub-clause and IEC sub-clause Amendment 1, 2001 IEC sub-clause IEC sub-clause 6.9 and ANSI/IEEE C62.11 sub-clause 8.16 to ANSI/IEEE C62.1 sub-clause 8.9 and IEC sub-clause and ANSI/IEEE C sub-clause and IEC sub-clause 6.101, 6.106, and IEC sub-clause IEC sub-clause and to IEC sub-clause 13 and IEC sub-clause 8.6 and IEC sub-clause ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C sub-clause 9.2 and 9.3 ANSI/IEEE C37.34 sub-clause 9.2 and ANSI/IEEE C37.41 sub-clause 6 and IEC sub-clause IEC IEC sub-clause IEC Annex B 2011 ANSI/IEEE C sub-clause (6)

2 Temperature-rise tests (E6) IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC note 1 sub-clause IEC note 2 sub-clause to IEC note 2 sub-clause IEC note 2 sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C37.09 sub-clause ANSI/IEEE C37.20 sub-clause and ANSI/IEEE C sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C sub-clause 6 ANSI/IEEE C37.34 sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C57.13 sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C sub-clause Note 1 - Together with one of the product specific s Note 2 - Together with IEC , (6)

3 Resistance Measurement of Main Circuit (E7) Resistance Measurement of Reactor Windings (E8) Short-time Current tests (E9) IEC sub-clause and IEC sub-clause in addition with reference to the following s IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C57.13 sub-clause IEC sub-clause IEC sub-clause IEC sub-clause , and IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C37.09 sub-clause ANSI/IEEE C37.20 sub-clause and ANSI/IEEE C sub-clause and ANSI/IEEE C sub-clause and ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C sub-clause 8 ANSI/IEEE C37.34 sub-clause ANSI/IEEE C37.41 sub-clause (6)

4 Short-time Current tests (E9) (continued) Thermal burden (E10) Ferroresonance (E11) Transient response and Momentary Peak Current error (E12) Inter-turn Overvoltage (E13) Dielectric test on Aux. Circuits (E14) Voltage test as condition check (E15) ANSI/IEEE C sub-clause ANSI/IEEE C sub-clause 7.1 Note ANSI/IEEE C sub-clause 6.1 Note ANSI/IEEE C sub-clause 12 Note ANSI/IEEE C57.13 sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C93.1 sub-clause Note 3 - Together with ANSI/IEEE C , 2010 Note 4 - Together with ANSI/IEEE C , 2010 and ANSI/IEEE C , 2010 Note 5 - Together with ANSI/IEEE C , 2010 ANSI/IEEE C93.1 sub-clause IEC sub-clause ANSI/IEEE C93.1 sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C93.1 sub-clause IEC sub-clause IEC sub-clause in addition with reference to the following s IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C37.09 sub-clause (6)

5 Mekanisk provning Mechanical operation tests on h.v. switchgear (M1) Mechanical tests under severe ice conditions (M2) Mechanical tests under low and high temperature conditions (M3) Tightness tests (M4) IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause to IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause ANSI/IEEE C37.09 sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C37.30 sub-clause 6 - referring to 1997 ANSI/IEEE C , sub-clause 11 ANSI/IEEE C37.34 sub-clause ANSI/IEEE C sub-clause ANSI/IEEE C sub-clause IEC sub-clause Testing with IEC sub-clause methods IEC sub-clause included in IEC sub-clause M2 and M3 IEC sub-clause may also be IEC sub-clause performed at IEC sub-clause external IEC sub-clause laboratories IEC sub-clause when IEC sub-clause required. IEC sub-clause IEC sub-clause and IEC sub-clause IEC sub-clause in addition with reference to the following s IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause (6)

6 Tightness tests (M4) (continued) Static terminal load test (M5) IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause IEC sub-clause Ändringar är markerade med fet stil. Provtagning omfattas inte av ackrediteringen. Om laboratoriet ändå själv utför provtagning omfattas provningen inte av ackrediteringen. Ackrediteringsomfattningen är flexibel enligt vad som anges i detta beslut. Förändrade metoder där förändringarna innefattas i den flexibla ackrediteringen får, även om nytt beslut inte har utfärdats, användas som ackrediterade metoder. 6(6)