Elektrisk provning Making and Breaking tests - Circuit Breakers (E1) Pressure Relief tests and internal arc tests - Surge Arresters and instrument transformers (E2) Breaking Capacity, Service-duty - Onload Tap Changer (E3) Making and Breaking tests - HV Switches and Fuses (E4) Internal arc tests on Metal-enclosed Switchgear, GIS and Insulator sets (E5) IEC 62271-100 sub-clause 6.102 to 6.112 2012 IEC 62271-101 2012 IEC 62271-108 sub-clause 6.102 to 6.114 2005 IEC 62271-109 sub-clause 6.102 to 6.106 2013 IEC 62271-110 sub-clause 6.114 2012 IEC 62271-302 sub-clause 6.102 to 6.115 2010 ANSI/IEEE C37.09 sub-clause 4.6 to 4.8 and 1999 4.11 to 4.12 ANSI/IEEE C37.09a sub-clause 4.10 2005 ANSI/IEEE C37.09b sub-clause 4.8, 4.12 2010 ANSI/IEEE C37.20 sub-clause 5.2.4 and 6.4.8 1974 IEC 60099-1 sub-clause 8.7 1999 Amendment 1, 2001 IEC 60099-4 sub-clause 8.7 2009 IEC 61869-1 sub-clause 6.9 and 7.4.6 2007 ANSI/IEEE C62.11 sub-clause 8.16 to 8.18 2005 ANSI/IEEE C62.1 sub-clause 8.9 and 9.8 1989 IEC 60214-1 sub-clause 5.2.3 and 5.2.5 2014 ANSI/IEEE C57.131 sub-clause 5.2.2 and 5.2.4 2012 IEC 62271-102 sub-clause 6.101, 6.106, 2013 6.107 and 6.108 IEC 62271-103 sub-clause 6.101 2011 IEC 62271-104 sub-clause 6.102 and 2009 6.104 to 6.110 IEC 60282-1 sub-clause 13 and 14 1994 IEC 60282-2 sub-clause 8.6 and 8.7 1995 IEC 62271-105 sub-clause 6.101 2002 ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C37.34-1994 sub-clause 9.2 and 9.3 ANSI/IEEE C37.34 sub-clause 9.2 and 9.3 1994 ANSI/IEEE C37.41 sub-clause 6 and 12 2000 IEC 60466 sub-clause 6.106 1987 IEC 61467 2008 IEC 62271-200 sub-clause 6.106 2011 IEC 62271-203 Annex B 2011 ANSI/IEEE C37.122 sub-clause 5.8.1.12 1993 1(6)
Temperature-rise tests (E6) IEC 60044-8 sub-clause 8.2 2002 IEC 60137 sub-clause 8.7 2008 IEC 60214-1 sub-clause 5.2.2 2014 IEC 60282-1 sub-clause 12 1994 IEC 60282-2 sub-clause 8.5 1995 IEC 60466 sub-clause 6.3 1987 IEC 61869-1 note 1 sub-clause 7.2.2 2007 IEC 61869-2 note 2 sub-clause 7.2.2.201 to 2012 7.2.2.206 IEC 61869-3 note 2 sub-clause 7.2.2 2011 IEC 61869-5 note 2 sub-clause 7.2.2 2011 IEC 62271-1 sub-clause 6.5 2011 IEC 62271-100 sub-clause 6.5 2012 IEC 62271-102 sub-clause 6.5 2013 IEC 62271-103 sub-clause 6.5 2011 IEC 62271-104 sub-clause 6.5 2009 IEC 62271-105 sub-clause 6.5 2002 IEC 62271-108 sub-clause 6.5 2005 IEC 62271-109 sub-clause 6.5 2013 IEC 62271-200 sub-clause 6.5 2011 IEC 62271-203 sub-clause 6.5 2011 IEC 62271-205 sub-clause 6.5 2008 IEC 62271-302 sub-clause 6.5 2010 ANSI/IEEE C37.09 sub-clause 4.3 1999 ANSI/IEEE C37.20 sub-clause 5.2.2 and 8.2.2.2 1974 ANSI/IEEE C37.20.2 sub-clause 6.2.2 1999 ANSI/IEEE C37.20.3 sub-clause 6.2.2 2001 ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C37.34-1994 sub-clause 6 ANSI/IEEE C37.34 sub-clause 6 1994 ANSI/IEEE C37.122 sub-clause 5.8.1.1 1993 ANSI/IEEE C57.13 sub-clause 8.7 2008 ANSI/IEEE C57.19.00 sub-clause 7.2.3 2004 ANSI/IEEE C57.131 sub-clause 5.2.1 2012 Note 1 - Together with one of the product specific s Note 2 - Together with IEC 61869-1, 2007 2(6)
Resistance Measurement of Main Circuit (E7) Resistance Measurement of Reactor Windings (E8) Short-time Current tests (E9) IEC 62271-1 sub-clause 6.4 2011 and IEC 62271-200 sub-clause 6.4 2011 in addition with reference to the following s IEC 60466 sub-clause 6.4 1987 IEC 62271-100 sub-clause 6.4 2012 IEC 62271-102 sub-clause 6.4 2013 IEC 62271-103 sub-clause 6.4 2011 IEC 62271-104 sub-clause 6.4 2009 IEC 62271-105 sub-clause 6.4 2002 IEC 62271-108 sub-clause 6.4 2005 IEC 62271-109 sub-clause 6.4 2013 IEC 62271-203 sub-clause 6.4 2011 IEC 62271-205 sub-clause 6.4 2008 IEC 62271-302 sub-clause 6.4 2010 ANSI/IEEE C57.13 sub-clause 8.5 2008 IEC 60044-8 sub-clause 8.1 2002 IEC 60076-5 sub-clause 4 2006 IEC 60076-6 sub-clause 8.9.13, 9.10.10 2007 and 12.8.18 IEC 60137 sub-clause 8.8 2008 IEC 60214-1 sub-clause 5.2.4 2014 IEC 60466 sub-clause 6.5 1987 IEC 61869-2 sub-clause 7.2.201 2012 IEC 61869-3 sub-clause 7.2.301 2011 IEC 61869-5 sub-clause 7.2.502 2011 IEC 62271-1 sub-clause 6.6 2011 IEC 62271-100 sub-clause 6.6 2012 IEC 62271-102 sub-clause 6.6 2013 IEC 62271-103 sub-clause 6.6 2011 IEC 62271-104 sub-clause 6.6 2009 IEC 62271-108 sub-clause 6.6 2005 IEC 62271-109 sub-clause 6.6 2013 IEC 62271-200 sub-clause 6.6 2011 IEC 62271-203 sub-clause 6.6 2011 IEC 62271-205 sub-clause 6.6 2008 IEC 62271-302 sub-clause 6.6 2010 ANSI/IEEE C37.09 sub-clause 4.8.4.2 1999 ANSI/IEEE C37.20 sub-clause 5.2.3 and 8.2.2.3 1974 ANSI/IEEE C37.20.2 sub-clause 6.2.3 and 6.2.4 1999 ANSI/IEEE C37.20.3 sub-clause 6.2.3 and 6.2.4 1993 ANSI/IEEE C37.30 sub-clause 6 referring to 1997 ANSI/IEEE C37.34-1994 sub-clause 8 ANSI/IEEE C37.34 sub-clause 8 1994 ANSI/IEEE C37.41 sub-clause 10 2000 3(6)
Short-time Current tests (E9) (continued) Thermal burden (E10) Ferroresonance (E11) Transient response and Momentary Peak Current error (E12) Inter-turn Overvoltage (E13) Dielectric test on Aux. Circuits (E14) Voltage test as condition check (E15) ANSI/IEEE C37.122 sub-clause 5.8.1.6 1993 ANSI/IEEE C57.12.00 sub-clause 7.1 Note 3 2010 ANSI/IEEE C57.12.20 sub-clause 6.1 Note 4 2011 ANSI/IEEE C57.12.90 sub-clause 12 Note 5 2010 ANSI/IEEE C57.13 sub-clause 8.6 2008 ANSI/IEEE C57.131 sub-clause 5.2.3 2012 ANSI/IEEE C93.1 sub-clause 6.2.15 1990 Note 3 - Together with ANSI/IEEE C57.12.90, 2010 Note 4 - Together with ANSI/IEEE C57.12.00, 2010 and ANSI/IEEE C57.12.90, 2010 Note 5 - Together with ANSI/IEEE C57.12.00, 2010 ANSI/IEEE C93.1 sub-clause 6.2.14 1990 IEC 61869 5 sub-clause 7.2.503 2011 ANSI/IEEE C93.1 sub-clause 6.2.16 1990 IEC 60044-6 sub-clause 7.3.2 1992 IEC 61869 5 sub-clause 7.2.504 2011 ANSI/IEEE C93.1 sub-clause 6.2.17 1990 IEC 61869-2 sub-clause 7.3.204 2012 IEC 62271-1 sub-clause 6.10.6 2011 in addition with reference to the following s IEC 60466 sub-clause 6.1.10 1987 IEC 62271-100 sub-clause 6.2.10 2012 IEC 62271-102 sub-clause 6.2.10 2013 IEC 62271-104 sub-clause 6.10.6 2009 IEC 62271-200 sub-clause 6.2.10 2011 IEC 62271-203 sub-clause 6.2.10 2011 IEC 62271-1 sub-clause 6.2.11 2011 IEC 62271-100 sub-clause 6.2.11 2012 IEC 62271-102 sub-clause 6.2.11 2013 IEC 62271-109 sub-clause 6.2.11 2013 IEC 62271-200 sub-clause 6.2.11 2011 IEC 62271-203 sub-clause 6.2.11 2011 ANSI/IEEE C37.09 sub-clause 4.8.5.6 1999 4(6)
Mekanisk provning Mechanical operation tests on h.v. switchgear (M1) Mechanical tests under severe ice conditions (M2) Mechanical tests under low and high temperature conditions (M3) Tightness tests (M4) IEC 60214-1 sub-clause 5.2.5 2003 IEC 60282-2 sub-clause 8.8 1995 IEC 60466 sub-clause 6.102 1987 IEC 62271-100 sub-clause 6.101.2 2012 IEC 62271-102 sub-clause 6.102 2013 IEC 62271-103 sub-clause 6.102 2011 IEC 62271-104 sub-clause 6.101.1 to 2009 6.101.4 IEC 62271-105 sub-clause 6.102 2002 IEC 62271-108 sub-clause 6.101 2005 IEC 62271-109 sub-clause 6.101.2 2013 IEC 62271-200 sub-clause 6.102 2011 IEC 62271-203 sub-clause 6.102 2011 IEC 62271-205 sub-clause 6.101.2 2008 IEC 62271-302 sub-clause 6.101.2 2010 ANSI/IEEE C37.09 sub-clause 4.13 1999 ANSI/IEEE C37.20.2 sub-clause 6.2.6 1999 ANSI/IEEE C37.20.3 sub-clause 6.2.5 2001 ANSI/IEEE C37.30 sub-clause 6 - referring to 1997 ANSI/IEEE C37.34-1994, sub-clause 11 ANSI/IEEE C37.34 sub-clause 11 1994 ANSI/IEEE C37.122 sub-clause 5.8.1.8 1993 ANSI/IEEE C57.131 sub-clause 5.2.5 2012 IEC 62271-100 sub-clause 6.101.5 2012 Testing with IEC 62271-102 sub-clause 6.103 2013 methods IEC 62271-104 sub-clause 6.101.5 2009 included in IEC 62271-108 sub-clause 6.101 2005 M2 and M3 IEC 62271-109 sub-clause 6.101.5 2013 may also be IEC 62271-205 sub-clause 6.101.4 2008 performed at IEC 62271-100 sub-clause 6.101.3 2012 external IEC 62271-102 sub-clause 6.104 2013 laboratories IEC 62271-108 sub-clause 6.101 2005 when IEC 62271-109 sub-clause 6.101.3 2013 required. IEC 62271-205 sub-clause 6.101.3 2008 IEC 62271-302 sub-clause 6.101.2.5 and 2010 6.101.2.6 IEC 60137 sub-clause 9.8 2008 IEC 62271-1 sub-clause 6.8 2011 in addition with reference to the following s IEC 62271-100 sub-clause 6.8 2012 IEC 62271-102 sub-clause 6.8 2013 IEC 62271-104 sub-clause 6.8 2009 IEC 62271-108 sub-clause 6.8 2005 IEC 62271-109 sub-clause 6.8 2013 IEC 62271-200 sub-clause 6.8 2011 IEC 62271-203 sub-clause 6.8 2011 5(6)
Tightness tests (M4) (continued) Static terminal load test (M5) IEC 62271-302 sub-clause 6.8 2010 IEC 60137 sub-clause 8.9 2008 IEC 61869-1 sub-clause 7.4.5 2007 IEC 62271-100 sub-clause 6.101.6 2012 IEC 62271-205 sub-clause 6.101.5 2008 Ändringar är markerade med fet stil. Provtagning omfattas inte av ackrediteringen. Om laboratoriet ändå själv utför provtagning omfattas provningen inte av ackrediteringen. Ackrediteringsomfattningen är flexibel enligt vad som anges i detta beslut. Förändrade metoder där förändringarna innefattas i den flexibla ackrediteringen får, även om nytt beslut inte har utfärdats, användas som ackrediterade metoder. 6(6)